|
PS # -PART-YEAR |
REVISION |
AMENDMENT |
SUBJECT |
STATUS |
|---|---|---|---|---|
| 1098-1974 | -- | -- | Lever switches (general requirements and measuring methods). | Active |
| 1099-1974 | -- | -- | Lever switches (requirements for switches of type-2 quick make-quick break) toggle switches.). | Active |
| 1100-1974 | -- | -- | Rotary Wafer Switches low current rating (general requirements and measuring methods). | Active |
| 1100-A-1974 | -- | -- | Rotary Wafer Switches low current rating (general requirements and measuring methods). | Active |
| 1101-1974 | -- | -- | Rotary wafer switches with central mounting | Active |
| 1101-A-1974 | -- | -- | Rotary wafer switches with central mounting | Active |
| 1102-1974 | -- | -- | Rotary switches with two-hole mounting. | Active |
| 1102-A-1974 | -- | -- | Rotary switches with two-hole mounting. | Active |
| 1103-1974 | -- | -- | Rotary wafer switches with central mounting; maximum 12 positions; maximum diameter 40 mm. | Active |
| 1104-1974 | -- | -- | Rotary wafer switches with two-hole mounting; maximum 26 position; maximum diameter 60 mm. | Active |
| 1105-1974 | -- | -- | Dimensions for pot-cores made of ferromegnatic oxides and associated parts. | Active |
| 1106-1974 | -- | -- | Rating systems for electronic tubes and valves and analogous semi-conductor devices. | Active |
| 1107-1974 | -- | -- | Numbering of electrodes and designation of units in electronic tubes and valves. | Active |
| 1108-1991 | -- | -- | Methods of measurement of essential electrical properties of receiving aerial in the frequency range from 30 MHz to 1000 MHz. (withdrawn & superseded by PS 2996-1991) | withdrawn & superseded by PS 2996-1991 |
| 1109-1974 | -- | -- | Preparation of outline drawings of oscilloscope and picture tubes. | Active |
| 1110-1974 | -- | -- | Series capacitors for power systems. | Active |
| 1111-1974 | -- | -- | Semiconductor convertors. (Withdrawn & supersede by PS: 2899-4-1990). | Withdrawn & supersede by PS: 2899-4-1990 |
| 1112-1974 | -- | -- | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. General terminology. (Withdrawn & supersede by PS: 2345-1990). | Withdrawn & supersede by PS: 2345-1990 |
| 1113-1974 | -- | -- | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. Essential ratings and characteristics. (Withdrawn & supersede by PS: 2345-1990). | Withdrawn & supersede by PS: 2345-1990 |
| 1114-1974 | -- | -- | Essential ratings and characteristics of semiconductor devices and general principles of measuring methods. General principles of measuring methods. (Withdrawn & supersede by PS: 2345-1990). | Withdrawn & supersede by PS: 2345-1990 |