|
PS # -PART-YEAR |
REVISION |
AMENDMENT |
SUBJECT |
STATUS |
|---|---|---|---|---|
| 4192-1998 | -- | -- | Guide to the measurement of equivalent electrical parameters of quartz crystal units. | Active |
| 4193-1998 | -- | -- | Characteristics and measurements of ultrasonic piezoceramic transducers. | Active |
| 4194-1-1998 | -- | -- | Quartz crystal units- A specification in the IEC Quality Assessment System for Electronic Components (IECQ)- Part 1: Generic specification. | Active |
| 4194-2-1998 | -- | -- | Quartz crystal units- A specification in the IEC Quality Assessment System for Electronic Components (IECQ)- Part 2: Sectional specification- Capability approval. | Active |
| 4194-2-1-1998 | -- | -- | Quartz crystal units- A specification in the IEC Quality Assessment System for Electronic Components (IECQ)- Part 2: Sectional specification- Capability approval- Section 1: Blank detail specification. | Active |
| 4194-3-1998 | -- | -- | Quartz crystal units- A specification in the IEC Quality Assessment System for Electronic Components (IECQ)- Part 3: Sectional specification- Qualification approval. | Active |
| 4194-3-1-1998 | -- | -- | Quartz crystal units- A specification in the IEC Quality Assessment System for Electronic Components (IECQ)- Part 3: Sectional specification- Qualification approval- Section 1: Blank detail specification. | Active |
| 4195-1998 | -- | -- | Piezoelectric devices- Preparation of outline drawings of surface-mounted devices. (SMD) for frequency control and Selection-General rules. | Active |
| 4196-1-1998 | -- | -- | Piezoelectric ceramic resonators- A specification in the IEC Quality Assessment System for electronic components (IECQ)- Part 1: Generic specification- Qualification approval. | Active |
| 4196-2-1998 | -- | -- | Piezoelectric ceramic resonators- A specification in the IEC Quality Assessment System for electronic components (IECQ)- Part 2 : Sectional specification- Qualification approval. | Active |
| 4196-2-1-1998 | -- | -- | Piezoelectric ceramic resonators- A specification in the IEC Quality Assessment System for electronic components (IECQ). Part 2: Sectional specification- Qualification approval. Section 1: Blank detail specification- Assessment level E. | Active |
| 4197-1-1998 | -- | -- | Piezoelectric ceramic filters for use in electronic equipment. A specification in the IEC quality assessment system for electronic components (IECQ)- Part 1:Generic specification- Qualification approval. | Active |
| 4197-2-1998 | -- | -- | Piezoelectric ceramic filters for use in electronic equipment. A specification in the IEC quality assessment system for electronic components (IECQ)- Part 2: Sectional specification- Qualification approval. | Active |
| 4197-2-1-1998 | -- | -- | Piezoelectric ceramic filters for use in electronic equipment. A specification in the IEC quality assessment system for electronic components (IECQ) – Part 2: Sectional specification-Qualification approval- section 1: Blank detail specification-Assessmen | Active |
| 4198-1-1-2001 | -- | -- | Filters using waveguide type dielectric resonators. Part 1: general information, standard values and test conditions-Section 1: General information and standard values. | Active |
| 4198-1-2-2001 | -- | -- | Filters using waveguide type dielectric resonators - Part 1-2: Test conditons. | Active |
| 4199-1998 | -- | -- | Methods for the measurement of frequency and equivalent resistance of unwanted resonances of filter crystal units. | Active |
| 4200-3-1998 | -- | -- | Surface acoustic wave (SAW) filters. Part 3: Standard outlines (Chapter IV). | Active |
| 4201-1-1-1998 | -- | -- | Waveguide type dielectric resonators. Part 1: General information and test conditions - Section 1: General information. | Active |
| 4202-1998 | -- | -- | Calibration of fibre optic power meters. IEC-1315/1995 | Active |