|
PS # -PART-YEAR |
REVISION |
AMENDMENT |
SUBJECT |
STATUS |
|---|---|---|---|---|
| 2905-1-1990 | -- | -- | Plastic film dielectric rotary variable tuning capacitors grade-2. Part-1: General requirements for test and measuring methods. | Active |
| 2906-1-1990 | -- | -- | Variable capacitors. Part-1: Terms and method of test. | Active |
| 2907-1990 | -- | -- | Guide for choice of calours to be used for the marking of capacitors and resistors. | Active |
| 2908-1990 | -- | -- | Method of measurements of non-linearity in resistors. | Active |
| 2909-1-1990 | -- | -- | Ceramic dielectric disc style rotary variable pre-set capacitors: grade -2. Part- 1: General requirements for test and measuring methods. | Active |
| 2910-1990 | -- | -- | Method for the determination of the space required by capacitors and resistors with unidirectional terminations. | Active |
| 2911-1-1990 | -- | -- | Semiconductor devices. Integrated circuits. Part 1: General. | Active |
| 2911-2-1990 | -- | -- | Semiconductor devices. Integrated circuits. Part-2: Digital integrated circuits. | Active |
| 2911-2-1-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section One: Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays). | Active |
| 2911-2-2-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section Two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU. | Active |
| 2911-2-3-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section Three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU). | Active |
| 2911-2-4-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section Four: Family specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB). | Active |
| 2911-2-5-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section Five: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB). | Active |
| 2911-2-6-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section Six: Blank detail specification for microprocessor integrated circuits. | Active |
| 2911-2-7-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section Seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories. | Active |
| 2911-2-8-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section Eight: Blank detail specification for integrated circuit static read / write memories. | Active |
| 2911-2-9-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories. | Active |
| 2911-2-10-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 2: Digital integrated circuits- Section 10: Blank detail specification for integrated circuit dynamic read / write memories. | Active |
| 2911-3-1990 | -- | -- | Semiconductor devices. Integrated circuits. Part-3: Analogue integrated circuits. | Active |
| 2911-3-1-1998 | -- | -- | Semiconductor devices- Integrated circuits- Part 3: Analogue integrated circuits- Section One: Blank detail specification for monolithic integrated operational amplifiers. | Active |